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Atomic Force Microscopy01:08

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Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
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Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry
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Probe-Sample Interaction-Independent Atomic Force Microscopy-Infrared Spectroscopy: Toward Robust Nanoscale

Seth Kenkel1,2, Anirudh Mittal1,3, Shachi Mittal1,3

  • 1Beckman Institute for Advanced Science and Technology , University of Illinois at Urbana-Champaign , Urbana , Illinois 61801 , United States.

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|June 26, 2018
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Summary

This study introduces a new method to remove probe-sample interaction effects in atomic force microscopy infrared spectroscopy (AFM-IR) imaging. This technique improves the accuracy and sensitivity of nanoscale chemical analysis for various materials.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Nanotechnology

Background:

  • Atomic Force Microscopy combined with Infrared Spectroscopy (AFM-IR) enables correlated structural and chemical imaging at the nanoscale.
  • The probe-sample interaction effect, influenced by sample mechanical properties, can distort AFM-IR spectral data, impacting analytical accuracy.
  • Current methods like resonance-enhanced imaging and signal normalization are not universally effective in mitigating these effects.

Purpose of the Study:

  • To develop and validate a novel analytical model and experimental method for removing probe-sample interaction effects in AFM-IR.
  • To enhance the sensitivity, accuracy, and repeatability of nanoscale chemical measurements in AFM-IR.
  • To enable reliable chemical identification at nanoscale resolutions for arbitrary soft matter samples.

Main Methods:

  • Developed a fully analytical model relating cantilever response to local sample expansion.
  • Introduced a new method measuring cantilever responsivity using mechanically induced, out-of-plane sample vibration to correct for probe-sample interactions.
  • Applied the method to model polymers and mammary epithelial cells.

Main Results:

  • Demonstrated successful removal of probe-sample interaction effects in AFM-IR images.
  • Showed significant improvements in sensitivity, accuracy, and repeatability for soft matter analysis compared to resonance-enhanced operation.
  • Validated the method's effectiveness on diverse samples including polymers and biological cells.

Conclusions:

  • Understanding and correcting for sample-dependent cantilever responsivity is crucial for accurate nanoscale chemical imaging with AFM-IR.
  • The presented method offers a robust solution for mitigating probe-sample interaction effects, advancing AFM-IR capabilities.
  • This work paves the way for reliable nanoscale chemical identification of complex and arbitrary samples using AFM-IR.