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Updated: Feb 8, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
A Fraczkiewicz1, F Lorut2, G Audoit1
1Univ. Grenoble Alpes, Grenoble F-38000, France; CEA, LETI, MINATEC Campus, Grenoble F-38054, France.
3D integration in microelectronics requires advanced imaging. This study compares destructive and non-destructive 3D characterization techniques for copper pillars, finding lab-based methods suit spot checks and synchrotron imaging suits batch analysis.
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