Beams
Transmission Electron Microscopy
Magnetic Moment of an Electron
Deflection of a Beam
Electron Affinity
Electron Carriers
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Updated: Feb 8, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
A I Lozano1, J C Oller2, K Krupa1
1Instituto de Física Fundamental, Consejo Superior de Investigaciones Científicas, Madrid, Spain.
This study introduces a new method for precise electron scattering cross section measurements in molecules. The technique uses a magnetically confined electron beam and a gas trap, achieving high accuracy for low and intermediate energy ranges.
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