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High speed CMOS acquisition system based on FPGA embedded image processing for electro-optical measurements.

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This study introduces a high-speed system for electro-optical measurements using CMOS sensors and FPGA boards. The system enables real-time plasmonic-based electrochemical impedance spectroscopy (P-EIS) with high spatial resolution.

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Area of Science:

  • Electro-optical measurements
  • Plasmonic-based electrochemical impedance spectroscopy (P-EIS)
  • Sensor technology

Background:

  • Electro-optical measurements rely on refractive index changes due to surface charge density.
  • Plasmonic-based electrochemical impedance spectroscopy (P-EIS) offers high spatial resolution without microelectrodes.
  • Advanced imaging systems are needed for real-time analysis of these phenomena.

Purpose of the Study:

  • To develop and validate a high-speed image acquisition and processing system for electro-optical measurements.
  • To enable real-time, angle-resolved P-EIS with optical spatial resolution.
  • To demonstrate the system's capability for sensitive amplitude variation detection.

Main Methods:

  • Utilized a high-speed CMOS sensor and a field-programmable gate array (FPGA) board for image acquisition and processing.
  • Implemented Fourier analysis on a per-pixel basis within the FPGA for deriving impedance components.
  • Synchronized an AC field generator with the acquisition system for phase measurements.

Main Results:

  • Successfully performed real-time angle-resolved electro-plasmonic measurements from 30 Hz to 10 kHz.
  • Achieved results consistent with conventional electrical impedance spectroscopy.
  • Detected amplitude variations as low as ±1% with 8 samples per period.

Conclusions:

  • The developed system provides a powerful tool for high-speed, high-resolution P-EIS.
  • The system is suitable for simultaneous angle-resolved P-EIS imaging with multiple synchronized boards.
  • This technology advances electro-optical sensing and impedance spectroscopy applications.