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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source

Guangxu Ju1, Matthew J Highland1, Carol Thompson2

  • 1Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.

Journal of Synchrotron Radiation
|July 7, 2018
PubMed

Keywords:
brightnesscoherencedivergence

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