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Updated: Feb 8, 2026

Monolayer Contact Doping of Silicon Surfaces and Nanowires Using Organophosphorus Compounds
Published on: December 2, 2013
Tommi Huhtamäki1, Xuelin Tian1,2, Juuso T Korhonen1,3
1Department of Applied Physics, School of Science, Aalto University, Espoo, Finland.
This study details a reliable protocol for measuring surface wetting using sessile-drop goniometry. It provides a method for accurate advancing contact angle (ACA) and receding contact angle (RCA) measurements for various materials.
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