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Direct S-matrix calculation for diffractive structures and metasurfaces.

Alexey A Shcherbakov¹, Yury V Stebunov^1,2, Denis F Baidin¹

¹Moscow Institute of Physics and Technology, Dolgoprudniy 141700, Russia.

Physical Review. E

|July 18, 2018

Summary

This summary is machine-generated.

This study derives general formulas for S-matrix components of diffractive structures and metasurfaces in the Fourier domain. These analytical results enable improved numerical methods for analyzing optical phenomena like plasmon excitation.

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Area of Science:

Optics and Photonics
Materials Science
Computational Electromagnetics

Background:

Diffractive structures and metasurfaces are crucial for manipulating light.
Accurate modeling of their electromagnetic response is essential for device design.
Existing Fourier domain methods have limitations for complex structures.

Purpose of the Study:

To derive general analytical formulas for S-matrix components applicable to arbitrary planar diffractive structures and metasurfaces.
To extend these formulas for periodically corrugated layers of two-dimensional materials.
To provide a foundation for enhanced numerical methods in Fourier domain analysis.

Main Methods:

Derivation of analytical S-matrix components in the Fourier domain.
Formulation applicable to both Cartesian and curvilinear metrics.
Development of expressions for S-matrix calculation in periodically corrugated 2D material layers.

Main Results:

General formulas for S-matrix components of planar diffractive structures and metasurfaces.
Validated expressions for corrugated 2D material layers, independent of corrugation depth-to-period ratio.
Successful simulation of resonant grating excitation of graphene plasmons with and without a silica interlayer.

Conclusions:

The derived analytical formulas offer a powerful tool for analyzing complex optical structures.
The method enhances existing Fourier domain techniques for improved accuracy and efficiency.
The study demonstrates the practical application in simulating plasmonic phenomena and interlayer effects.