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Epitaxial 8YSZ/Y2Zr2O7 multilayers: a conductivity and strain study
Elisa Gilardi1, Giuliano Gregori, Joachim Maier
1Max Planck Institute for Solid State Research, Stuttgart, Germany. elisa.gilardi@psi.ch.
Physical Chemistry Chemical Physics : PCCP
|July 20, 2018
Summary
Yttria-stabilized zirconia (YSZ) thin films exhibit ionic conductivity unaffected by microstructure or compressive strain. Grain boundaries and strain fields minimally impede oxygen vacancy transport in these advanced ceramic materials.
Area of Science:
- Solid-state chemistry
- Materials science
- Ceramic electrolytes
Background:
- Yttria-stabilized zirconia (YSZ) is a key material for solid oxide fuel cells (SOFCs).
- Understanding ionic transport in YSZ thin films is crucial for developing advanced energy devices.
- Microstructure and strain effects on conductivity require further investigation.
Purpose of the Study:
- To investigate the ionic conductivity of Y2Zr2O7 thin films.
- To determine the influence of microstructure (epitaxial vs. textured) on ionic transport.
- To evaluate the impact of compressive strain in YSZ multilayers on electrical properties.
Main Methods:
- Pulsed laser deposition (PLD) for thin film and multilayer fabrication.
- Electrical impedance spectroscopy (EIS) for conductivity measurements.
- X-ray diffraction (XRD) analysis for structural and strain characterization.
Main Results:
- Ionic conductivity of Y2Zr2O7 films was largely independent of microstructure.
- Grain boundaries showed minimal blocking of oxygen vacancy transport.
- Compressive strain in YSZ multilayers did not significantly affect ionic conductivity.
Conclusions:
- Microstructure and grain boundaries have a minor impact on oxygen vacancy transport in Y2Zr2O7.
- Residual compressive strain does not impede ionic transport in YSZ multilayers.
- YSZ thin films offer promising ionic conductivity for energy applications.
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