Semiconductors
Types of Semiconductors
Strategies for Assessing and Addressing Confounding
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Dimensional Analysis
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Updated: Feb 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Bonnie Choi1, Kihong Lee1, Anastasia Voevodin1
1Department of Chemistry , Columbia University , New York , New York 10027 , United States.
Researchers developed a novel 2D semiconductor with unique surface reactive sites. This allows for chemical functionalization without damaging the material, enabling tunable properties for advanced applications.
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