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Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales
Abhijeet Gujrati1, Subarna R Khanal1, Lars Pastewka2
1Mechanical Engineering and Materials Science , University of Pittsburgh , Pittsburgh , Pennsylvania 15261 , United States.
ACS Applied Materials & Interfaces
|July 28, 2018
Summary
Surface roughness measurements vary with scale. This study combines angstrom-scale imaging with other techniques to create scale-independent roughness parameters for ultrananocrystalline diamond surfaces.
Area of Science:
- Materials Science
- Surface Science
- Nanotechnology
Background:
- Surface roughness significantly impacts functional properties like adhesion, friction, and transport.
- Quantifying roughness is challenging due to fractal-like surface topography and scale-dependent measurements.
Purpose of the Study:
- To develop a comprehensive multiscale characterization of ultrananocrystalline diamond (UNCD) surface topography.
- To derive scale-independent roughness parameters for improved surface analysis.
Main Methods:
- Utilized angstrom-scale Transmission Electron Microscopy (TEM) combined with stylus profilometry and Atomic Force Microscopy.
- Performed over 100 measurements across 8 orders of magnitude in size.
- Employed power spectral density analysis to compute scale-independent parameters.
Main Results:
- Demonstrated angstrom-scale characterization of UNCD surfaces.
- Showed that RMS roughness parameters vary significantly with measurement scale.
- Revealed scale-independent parameters, indicating even "smooth" UNCD surfaces have a high RMS slope (>1).
Conclusions:
- A multiscale roughness characterization approach provides a robust description of surface topography.
- This method enables systematic evaluation and optimization of technologically relevant surfaces.
- Facilitates rigorous testing of analytical and numerical models for rough surface behavior.
Keywords:
atomic force microscopy (AFM)hurst exponentpower spectral density (PSD)self-affinitysurface roughness parameterssurface topographytransmission electron microscopy (TEM)ultrananocrystalline diamond (UNCD)More Related Videos
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