Layers of the Epidermis
Thematic Layering in GIS
Layers of the Heart Wall
Boundary Layer Characteristics
Thin-Layer Chromatography (TLC): Overview
Outer Layers of the Cell Envelope
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Feb 7, 2026

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
H Y Sun1, Z W Mao1, T W Zhang1
1National Laboratory of Solid State Microstructures, Jiangsu Key Laboratory of Artificial Functional Materials, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, 210093, Nanjing, China.
Researchers developed a new in situ method using Kikuchi lines to monitor atomic layer growth of strontium titanate films. This technique precisely controls chemical composition, enabling sharp oxide interfaces for quantum applications.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: