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Elastic moduli and refractive index of γ-Ge<sub>3</sub>N<sub>4</sub>.

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Updated: Feb 7, 2026

Low-energy Cathodoluminescence for OxyNitride Phosphors

Low-energy Cathodoluminescence for OxyNitride Phosphors

Published on: November 15, 2016

Determining the Nitrogen Content in (Oxy)Nitride Materials.

Franck Tessier¹

¹Univ. Rennes, CNRS, ISCR (Institut des Sciences Chimiques de Rennes)-UMR 6226, F-35000 Rennes, France. Franck.Tessier@univ-rennes1.fr.

Materials (Basel, Switzerland)

|August 4, 2018

Summary

Accurately determining nitrogen and oxygen in materials is crucial but challenging. This study reviews various chemical and physical methods, highlighting their effectiveness for bulk and thin film analysis.

Keywords:

(oxy)nitride nitrogen analysis powder thin films

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Area of Science:

Materials Science
Analytical Chemistry

Background:

Accurate determination of nitrogen and oxygen is vital for characterizing (oxy)nitride materials.
Analyzing these anions presents challenges, particularly for certain material types and thin films.

Purpose of the Study:

To review and compare various chemical and physical techniques for nitrogen and oxygen determination in materials.
To highlight the applicability and limitations of these methods for both bulk powders and thin films.

Main Methods:

Carrier gas hot extraction (CGHE) for bulk materials.
Electron probe microanalysis with wavelength dispersive spectroscopy (EPMA-WDS) for thin films.
Compilation of diverse chemical and physical analytical routes.

Main Results:

CGHE and EPMA-WDS are identified as attractive methods for bulk and thin film analysis, respectively.
The study evaluates the performance of multiple techniques for anionic content determination.
Limitations and challenges associated with analyzing powders and films are discussed.

Conclusions:

A comprehensive overview of available methodologies for nitrogen and oxygen analysis in (oxy)nitride materials is provided.
The choice of technique depends on the material form (bulk vs. thin film) and specific analytical requirements.
Understanding method limitations is key to achieving accurate material characterization.