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A Calibration Method for Acoustic Space Charge Measurements Using Multilayer Samples
Guillermo Mier-Escurra1, Armando Rodrigo-Mor2, Peter Vaessen3
1DC Systems, Energy Conversion & Storage, Department Electrical Sustainable Energy, Delft University of Technology, Mekelweg 4, 2628CD Delft, The Netherlands. G.A.MierEscurra@tudelft.nl.
This study introduces a new method for applying known charges to dielectric samples, essential for calibrating space charge measurement equipment. This technique ensures standardized measurements and improves the accuracy of dielectric material characterization.
Area of Science:
- Dielectric materials science
- Electrical insulation engineering
- Metrology for charge measurement
Background:
- Accurate measurement of space charges in dielectrics is crucial for material characterization and performance assessment.
- Existing space charge measurement methods require reliable calibration and characterization of equipment for standardized results.
Purpose of the Study:
- To present a novel method for applying known charges to dielectric samples for calibration purposes.
- To enable comparison between measured and applied charges using acoustic and thermal methods.
- To facilitate the measurement of resolution and accuracy in space charge measurement systems.
Main Methods:
- Development of a technique to inject known quantities of charge into dielectric samples.
- Experimental validation using single-layer and multilayer flat samples.
- Comparison of results obtained from the new calibration method with existing techniques.
Main Results:
- The presented method allows for the application of precisely known charges to dielectric samples.
- Experimental validation confirmed the method's utility for calibrating acoustic and thermal space charge measurement systems.
- The technique demonstrated its capability in assessing the resolution and accuracy of measurement systems.
Conclusions:
- The developed method provides a standardized approach for calibrating space charge measurement equipment.
- This technique is vital for ensuring the reliability and comparability of space charge measurements in dielectrics.
- The method contributes to advancing the field of dielectric material characterization and electrical insulation diagnostics.
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