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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Tarak K Patra, Fu Zhang, Daniel S Schulman
1Computational Institute , University of Chicago , Chicago , Illinois 60637 , United States.
Structural defects in two-dimensional transition-metal dichalcogenides (TMDs) organize into lines, driving phase transitions. This finding is crucial for advancing nanotechnology and designing new nanoscale devices.
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