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Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
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[Correction Methods of Temperature Drift for Infrared Spectral Emissivity Measurement System].

Yu-feng Zhang, Jing-min Dai, Xiao-dong Lu

    Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
    |August 8, 2018
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    This study introduces a polynomial fitting method to correct temperature drift in infrared spectral emissivity measurements. The technique enhances measurement repeatability by compensating for spectral responsivity variations with temperature.

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    Area of Science:

    • Optics and Photonics
    • Metrology
    • Infrared Spectroscopy

    Background:

    • Temperature drift in spectral responsivity affects the accuracy of infrared spectral emissivity measurements.
    • Repeatability is crucial for reliable spectral emissivity data, especially in demanding applications.

    Purpose of the Study:

    • To propose and validate a novel temperature drift correction method for infrared spectral emissivity measurement systems.
    • To improve the repeatability of spectral emissivity measurements by addressing spectral responsivity fluctuations.

    Main Methods:

    • Analyzing the relationship between detector output voltage and temperature.
    • Fitting the spectral response curve variation with temperature using polynomial equations.
    • Calculating spectral responsivity drift correction factors to adjust detector output voltage.

    Main Results:

    • A sixth-order polynomial fitting demonstrated excellent consistency in characterizing spectral response drift.
    • The proposed method effectively eliminated the impact of spectral response drift on detector output voltage.
    • Developed a temperature drift correction device to measure spectral response drift curves.

    Conclusions:

    • The polynomial fitting-based temperature drift correction method significantly improves the repeatability of infrared spectral emissivity measurement systems.
    • This approach provides a robust solution for accurate spectral emissivity measurements under varying temperature conditions.