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On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy

K Heinze1, O Arnould2, J-Y Delenne3

  • 1L2C, University of Montpellier, CNRS, Montpellier F-34000, France; IATE, University of Montpellier, INRA, CIRAD, Montpellier SupAgro, Montpellier, France.

Ultramicroscopy
|August 10, 2018
PubMed

Keywords:
AFMContact resonanceIndentation modulusNano-mechanicsSurface slope

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