Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Band Theory
Network Covalent Solids
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Feb 6, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Ying Gao1, Nan Gao, Hongdong Li
1State Key Lab of Superhard Materials, Jilin University, Changchun 130012, PR China. hdli@jlu.edu.cn.
Diamond substrates enable highly sensitive semiconductor surface-enhanced Raman spectroscopy (SERS) for detecting trace molecules. This breakthrough offers superior performance and broad applicability for molecular sensing technologies.
10:32Sample Preparation and Transfer Protocol for In-Vacuum Long-Wavelength Crystallography on Beamline I23 at Diamond Light Source
Published on: April 23, 2021
03:33Author Spotlight: Development and Application of SERS Flexible Substrates Using Synthesized AgNPs
Published on: November 17, 2023
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: