Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection

Optics Express
|August 17, 2018
PubMed
Summary

This study introduces an antireflection self-reference method using tantalum nitride (TaN) nanofilms to eliminate interference in terahertz (THz) reflection spectroscopy. The technique accurately recovers sample reflections, enhancing THz analysis for liquids and biological materials.

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