Interferometric autocorrelation of ultrafast optical pulses in silicon sub-micrometer p-i-n waveguides

We investigated the high-sensitivity interferometric autocorrelation of ultrafast optical pulses utilizing two-photon absorption in sub-micrometer silicon p-i-n waveguides. The autocorrelation sensitivities were evaluated to be about 0.5 and 4.5 × 10^-8 W² for 1- and 0.5-mm devices, respectively. Such sensitivities are about 100 times higher than the traditional two-photon conductivity photodetectors in commercial autocorrelators; thus favor weak pulse characterization. We comprehensively studied the interferometric autocorrelation performances by the experiment and FDTD (finite-difference time-domain) simulation. The pulse energy dependences of measured autocorrelation photocurrents and pulse widths were well explained by the simulation with the free carrier absorption and free carrier plasma effect considered. The autocorrelation error tends to occur if the pulse energy is high enough to cause strong free carrier effects and the threshold pulse energy for error occurrence is increased for shorter devices, but accurate autocorrelation measurement was achieved for sub-Watts pulses at which the influences of free carrier effects on interferometric autocorrelation was negligible. The minimum applicable range of pulse widths was estimated from waveguide dispersion analysis to be ~0.09 and 0.13 ps with a 10% target error for 0.5-mm and 1-mm devices, respectively. The interferometric autocorrelation in sub-micrometer silicon p-i-n waveguides is promising as a monolithic photonic device for on-chip monitor and diagnostics of weak ultrafast pulses.