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Related Experiment Video

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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

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Low-Frequency Noise in Graphene Tunnel Junctions.

Paweł Puczkarski¹, Qingqing Wu², Hatef Sadeghi²

¹Department of Materials , University of Oxford , 16 Parks Road , Oxford OX1 3PH , United Kingdom.

|August 18, 2018

Summary

Electrical noise in graphene tunnel junctions arises from charge traps in dielectrics. These traps modulate the potential barrier, affecting current variance at different temperatures, crucial for electronics and biosensing applications.

Keywords:

charge traps graphene low frequency noise random telegraph noise tunnel junctions

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Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Graphene tunnel junctions are vital for single molecule electronics and biosensing.
Understanding their electrical noise is critical for application development.

Purpose of the Study:

Investigate electrical noise properties of graphene tunnel junctions.
Identify the origin of observed noise spectra at different temperatures.
Develop a theoretical model to explain noise mechanisms.

Main Methods:

Fabrication of graphene tunnel junctions using feedback-controlled electroburning.
Electrical noise measurements at cryogenic (77 K) and room temperatures.
Development of a theoretical model coupling quantum tunnel barriers with classical fluctuators (charge traps).

Main Results:

Observed random telegraph signals with Lorentzian noise at 77 K and 1/f noise at room temperature.
Identified charge traps in the dielectric as the source of noise via electrostatic environment modulation.
Quantified current variance (20-60% at room temp, 10% at 77 K) and relative potential barrier shifts (6-10% at room temp, 3-4% at 77 K).
Demonstrated Poisson statistics governing random trap occupation and intertrap Coulomb interactions.

Conclusions:

Graphene tunnel junctions exhibit high sensitivity to their local electrostatic environment.
Charge trap dynamics in the dielectric are the primary source of electrical noise.
The findings provide insights into noise mechanisms for advancing graphene-based electronic and biosensing devices.