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    Area of Science:

    • Optics and Photonics
    • Metrology
    • Computer Vision

    Background:

    • Absolute phase retrieval is critical for accurate height measurement in digital fringe projection (DFP).
    • Conventional phase unwrapping methods often require multiple structured light patterns, increasing system complexity.
    • Existing techniques struggle with complex surfaces and limited depth ranges.

    Purpose of the Study:

    • To develop novel, simplified pixel-by-pixel absolute phase retrieval techniques for DFP.
    • To reduce the number of projected patterns required for accurate height measurements.
    • To enable absolute phase retrieval across diverse object depth ranges and surface discontinuities.

    Main Methods:

    • Proposed two reference-plane-based absolute phase retrieval techniques.
    • Developed a single-frequency method for limited height ranges using one reference plane.
    • Introduced a dual-frequency method with two reference planes for extended depth range and step-height surfaces.

    Main Results:

    • Demonstrated effective absolute phase retrieval with minimal projections.
    • Achieved accurate height measurements for objects within defined height limits.
    • Successfully extended measurement depth range and handled objects with step-height discontinuities.

    Conclusions:

    • The proposed techniques simplify absolute phase retrieval in DFP systems.
    • These methods offer efficient and accurate height measurements for various object types and depths.
    • The techniques are robust and suitable for real-world metrology applications.