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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Glen D O'Neil1, Han-Wen Kuo2, Duncan N Lomax1
1Department of Chemical Engineering , Columbia University in the City of New York , New York , New York 10027 , United States.
This study introduces a new scanning probe microscopy (SPM) method combining line probes and compressed sensing (CS) to overcome speed limitations. This approach enables faster chemical imaging of materials, enhancing SPM applications.
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