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Biphasic-Scanning Ion Conductance Microscopy.

Myunghoon Choi1, Lane A Baker1

  • 1Department of Chemistry , Indiana University , 800 E. Kirkwood Avenue , Bloomington , Indiana 47405 , United States.

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|September 21, 2018
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A new biphasic-scanning ion conductance microscopy (BP-SICM) method uses two solutions for enhanced probe control. This technique enables imaging under nonstandard conditions, including electrolyte-free baths, and shows unique feedback modes.

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Area of Science:

  • Nanoscale imaging
  • Surface science
  • Microscopy techniques

Background:

  • Scanning ion conductance microscopy (SICM) is a powerful technique for nanoscale imaging.
  • Standard SICM typically requires specific electrolyte concentrations for operation.
  • Controlling probe behavior and imaging under diverse conditions remains a challenge.

Purpose of the Study:

  • To introduce a novel imaging mechanism for scanning ion conductance microscopy (SICM).
  • To enable SICM imaging under nonstandard conditions, including the use of electrolyte-free solutions.
  • To demonstrate enhanced probe control and novel feedback mechanisms.

Main Methods:

  • Development and implementation of biphasic-SICM (BP-SICM).
  • Utilizing two distinct solution phases: one in a double-barrel pipet and one in the bath.
  • Operating under nonstandard SICM conditions, including electrolyte-free bath solutions.

Main Results:

  • BP-SICM successfully affords enhanced probe control.
  • Imaging is achievable under nonstandard conditions, broadening SICM applicability.
  • Both positive and negative feedback modes were observed during probe-surface interaction.

Conclusions:

  • Biphasic-SICM (BP-SICM) is a versatile advancement in scanning ion conductance microscopy.
  • The method allows for imaging in electrolyte-free solutions, expanding experimental possibilities.
  • BP-SICM offers unique feedback control, paving the way for new nanoscale investigations.