Distance Corrections
Beams
Power Factor Correction
Bonding in Metals
Metallic Solids
Alkali Metals
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Updated: Feb 5, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Hyoung Suk Park1, Sung Min Lee2, Hwa Pyung Kim2
1Division of Integrated Mathematics, National Institute for Mathematical Sciences, Daejeon, 34047, Korea.
This study introduces a novel deep learning method to correct beam hardening artifacts in computerized tomography (CT) scans. The sinogram-consistency approach effectively removes metal artifacts, improving image quality for medical imaging.
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