Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron

Fernando E Camino1, Vitor R Manfrinato2, Aaron Stein2

  • 1Center for Functional Nanomaterials, Brookhaven National Laboratory; fcamino@bnl.gov.

Summary

Researchers achieved single-digit nanometer patterning using an aberration-corrected electron microscope. This advanced electron-beam lithography method works with common resists like PMMA and HSQ for high-resolution feature creation.

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