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Polarimetric-Phase-Enhanced Intensity Interrogation Scheme for Surface Wave Optical Sensors with Low Optical Loss
Yuhang Wan1, Zheng Zheng2,3,4, Mengxuan Cheng5
1School of Electronic and Information Engineering, Beihang University, 37 Xueyuan Road, Beijing 100083, China. yuhangwan@buaa.edu.cn.
Abstract:
A polarimetric-phase-enhanced intensity interrogation scheme leveraging the polarization-dependent sharp phase change induced by the surface wave excitation at a low-optical-loss sensor's surface is proposed and experimentally demonstrated. Based on a simple setup with no moving parts during interrogation, a polarimetric-phase-enhanced intensity can be obtained by subtracting the reflected intensities of two beam polarization states. Our results show a ~4-fold sensitivity increase compared to traditional intensity detection schemes for similar sensors. As novel surface wave optical sensors are designed and engineered with optimized phase responses, this scheme offers a low-complexity solution for such devices instead of traditional phase interrogation schemes.
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