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Updated: Feb 4, 2026

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
Published on: July 20, 2022
Gaoliang Dai1, Xiukun Hu1, Sibylle Sievers1
1Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany.
A new metrological large range magnetic force microscope (Met. LR-MFM) offers traceable subnanometer accuracy over a 25 mm range. This advanced MFM bridges nanoscale and macroscale magnetic measurements.
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