Semiconductors
High-Performance Liquid Chromatography: Elution Process
Types of Semiconductors
Metal-Semiconductor Junctions
Enthalpy of Solution
Biasing of Metal-Semiconductor Junctions
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Feb 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Zhaoyang Lin1, Yuan Liu2,3, Udayabagya Halim1
1Department of Chemistry and Biochemistry, University of California, Los Angeles, CA, USA.
Researchers developed a new method to create high-quality, solution-processable two-dimensional (2D) semiconductor nanosheets. This breakthrough enables the fabrication of advanced electronics with significantly improved performance and versatility.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: