Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

Ashley D Slattery1,2, Cameron J Shearer3,4, Joseph G Shapter5,6

  • 1Flinders Institute for NanoScale Science and Technology, College of Science and Engineering, Flinders University, Bedford Park, SA 5042, Australia. Ashley.slattery@adelaide.edu.au.

Summary

PeakForce tapping (PFT) imaging offers stable, high-resolution imaging for carbon nanotube atomic force microscopy (CNT-AFM) probes. This method overcomes previous limitations, enabling detailed nanoscale characterization and artifact reduction.

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