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Electric Current Dependent Fracture in GaN Piezoelectric Semiconductor Ceramics

Guoshuai Qin1, Chunsheng Lu2, Xin Zhang3

  • 1School of Mechanics and Engineering Science, Zhengzhou University, Zhengzhou 450001, Henan, China. gsqin0404@163.com.

Materials (Basel, Switzerland)
|October 19, 2018
PubMed

Keywords:
GaN piezoelectric semiconductor ceramicsfracture criterionintensity factormechanical-electrical loadingpiezoelectric fractureGaN ceramicscurrent intensity factorselectromechanical couplingfracture criterion

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