Related Experiment Video
Updated: Feb 3, 2026

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry
Published on: September 15, 2020
Adsorption of a Polyethoxylated Surfactant from Aqueous Solution to Silica Nanoparticle Films Studied with In Situ
Suzanne L Warring1, Marta Krasowska, David A Beattie
1Department of Chemistry , University of Otago , Dunedin 9054 , New Zealand.
Abstract:
Polyethoxylated (PEO) surfactant adsorption to silica under aqueous conditions is an important physical process in a multitude of industries. Consequently, a considerable number of spectroscopic and other studies have been carried out to ascertain the molecular/structural details of the adsorbed surfactant and the kinetics of PEO surfactant adsorption. However, the use of infrared spectroscopy to probe surfactant adsorption at the silica/aqueous solution interface has been limited because of the instability of silica particle films under aqueous conditions and the opacity of silicon prisms below 1300 cm-1 typically employed for these studies. The work presented here provides infrared spectroscopic measurements of silica particle films formed from differing suspension pH on a diamond internal reflection prism to probe silica particle film stability as a function of pH. The films formed from a suspension pH of 2.5 were found to be the most stable owing to a sol-gel transition of the colloidal suspension upon drying and the reduction in electrostatic repulsion between silica nanoparticles, creating a tightly packed nanoparticle film. Colloid probe atomic force microscopy (CP-AFM) was used to confirm the alteration of surface forces between silica nanoparticles as a function of pH. Particle films from silica suspensions of pH 2.5 were formed in situ on an attenuated total reflection infrared diamond prism and used to probe Triton X-100 adsorption from an aqueous solution. The obtained infrared spectra revealed a critical surface aggregation concentration at a solution concentration of 0.14 mmol L-1, Triton X-100 forms discrete micelles at the silica surface, and the PEO head group preferentially adopts a helical conformation. Most intriguingly, a breakup of the silica particle film was observed at the critical micelle concentration of the surfactant. This is due to the repulsive steric forces arising from the interactions between the PEO corona of the surfactant micelles formed at the silica surface, as confirmed by the CP-AFM measurements.
More Related Videos
10:50Detection and Quantification of Plasmodium falciparum in Aqueous Red Blood Cells by Attenuated Total Reflection Infrared Spectroscopy and Multivariate Data Analysis
Published on: November 2, 2018
10:15Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
Published on: July 22, 2015
Related Concept Videos
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
The ATR process begins by directing a beam...
Chemical Reactions in Aqueous Solutions
Total Internal Reflection Fluorescence Microscopy
Aqueous Solutions and Heats of Hydration
When ionic compounds dissolve in water, the ions in the solid separate and disperse uniformly throughout the solution because water molecules surround and solvate the ions, reducing the strong electrostatic forces between them. This process...
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Intermolecular Forces in Solutions
When the strengths of the intermolecular forces of attraction between solute and solvent species in a solution are no different than those present in the separated components, the solution is formed with no accompanying energy change. Such a solution is called an ideal solution. A mixture of ideal gases (or gases such as helium and argon,...