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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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Related Experiment Video

Updated: Feb 3, 2026

Total Internal Reflection Absorption Spectroscopy TIRAS for the Detection of Solvated Electrons at a Plasma-liquid Interface
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Total Internal Reflection-Based Extinction Spectroscopy of Single Nanoparticles.

Meng Li1, Tinglian Yuan1, Yingyan Jiang1

  • 1School of Chemistry and Chemical Engineering, State Key Laboratory of Analytical Chemistry for Life Science, Nanjing University, Nanjing, Jiangsu, 210023, China.

Angewandte Chemie (International Ed. in English)
|November 7, 2018
PubMed
Summary
This summary is machine-generated.

Reflection-mode total internal reflection microscopy (TIRM) measures nanoparticle extinction spectra and differentiates light absorption and scattering. This technique uses an evanescent wave for enhanced reflectance changes, enabling detailed optical analysis of single nanoparticles.

Keywords:
extinction spectroscopynanoparticlessingle nanoparticle spectroscopytotal internal reflection

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Area of Science:

  • Nanophotonics and optical microscopy

Background:

  • Characterizing individual nanoparticles requires precise measurement of their optical properties, including extinction, absorption, and scattering.
  • Existing methods often struggle to differentiate between absorption and scattering components for single nanoparticles.

Purpose of the Study:

  • To develop and demonstrate a reflection-mode total internal reflection microscopy (TIRM) technique for analyzing individual nanoparticle optical properties.
  • To enable simultaneous measurement of extinction spectra and differentiation of absorption and scattering contributions.

Main Methods:

  • Utilizing an evanescent wave illumination with a light path length comparable to nanoparticle size.
  • Implementing TIRM to achieve significantly improved reflectance changes (ΔI/I₀) up to tens of percent.
  • Employing image processing to analyze optical patterns, distinguishing bright (scattering) and dark (absorption) centroids.

Main Results:

  • Successfully measured extinction spectra of individual dielectric, plasmonic, and light-absorbing nanoparticles.
  • Demonstrated the ability to differentiate between light scattering and absorption contributions to the total optical output.
  • Observed distinct optical patterns (bright and dark centroids) corresponding to scattering and absorption, respectively.
  • Showcased simultaneous analysis of tens of nanoparticles using wide-field TIRM with gentle illumination.

Conclusions:

  • Reflection-mode TIRM is a powerful tool for detailed optical characterization of single nanoparticles.
  • The technique effectively separates scattering and absorption components, providing deeper insights into nanoparticle optical behavior.
  • Wide-field TIRM allows for high-throughput analysis of nanoparticle ensembles under non-destructive illumination conditions.