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Updated: Feb 3, 2026

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Pixel-to-pixel variation on a calibrated PILATUS3-based multi-energy soft x-ray detector
P VanMeter1, L F Delgado-Aparicio2, L Reusch1
1Department of Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Abstract:
A multi-energy soft x-ray pin-hole camera based on the PILATUS3 100 K x-ray detector has recently been installed on the Madison Symmetric Torus. This photon-counting detector consists of a two-dimensional array of ∼100 000 pixels for which the photon lower-threshold cutoff energy E can be independently set for each pixel. This capability allows the measurement of plasma x-ray emissivity in multiple energy ranges with a unique combination of spatial and spectral resolution and the inference of a variety of important plasma properties (e.g., T e, n Z, Z eff). The energy dependence of each pixel is calibrated for the 1.6-6 keV range by scanning individual trimbit settings, while the detector is exposed to fluorescence emission from Ag, In, Mo, Ti, V, and Zr targets. The resulting data for each line are then fit to a characteristic "S-curve" which determines the mapping between the 64 possible trimbit settings for each pixel. The statistical variation of this calibration from pixel-to-pixel was explored, and it was found that the discreteness of trimbit settings results in an effective threshold resolution of ΔE < 100 eV. A separate calibration was performed for the 4-14 keV range, with a resolution of ΔE < 200 eV.
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