Noise mitigation methods for ion detectors operating with a direct view of high temperature plasmas

We have developed an ion current measurement instrument with a direct view of a plasma that reduces the particle and radiation-induced noise current it detects by over three orders of magnitude, from tens of microamps to tens of nanoamps. This is accomplished using electric fields, magnetic fields, and physical shielding that limit the flux of particles and radiation into the instrument and suppress the secondary electrons produced within it by particle and radiation impact. Operation of this detector in various configurations, without an ion beam, has allowed identification of the sources of noise current. In our experimental setup, the largest noise contributors were found to be plasma ions and photoelectric emission due to UV radiation.