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Updated: Feb 2, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Symmetry breakdown of electron emission in extreme ultraviolet photoionization of argon

M Ilchen1,2, G Hartmann3,4, E V Gryzlova5

  • 1European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany. markus.ilchen@xfel.eu.

Nature Communications
|November 9, 2018
PubMed

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