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Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Alexander Tolstogouzov1,2,3, Mikhail N Drozdov4, Sergey F Belykh3

  • 1Centre for Physics and Technological Research (CeFITec), Dept. de Física da Faculdade de Ciências e Tecnologia (FCT), Universidade Nova de Lisboa, 2829-516, Caparica, Portugal.

Rapid Communications in Mass Spectrometry : RCM
|November 9, 2018
PubMed
Abstract

No abstract available in PubMed .

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