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Updated: Feb 2, 2026

Bacterial Immobilization for Imaging by Atomic Force Microscopy
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Thermoelectric stack sample cooling modification of a commercial atomic force microscopy

A Del Moral1, J C González-Rosillo2, A Gómez2

  • 1Instituto de Microelectrónica de Barcelona, Centro Nacional de Microelectrónica (CSIC), Campus U.A.B., Bellaterra, Barcelona 08193, Spain; Institut de Ciència dels Materials de Barcelona, UAB Campus, Bellaterra 08193, Spain.

Ultramicroscopy
|November 16, 2018
PubMed

Keywords:
Atomic Force MicroscopyCoolingCurrent sensing atomic force microscopyInstrumentationPeltierSample coolingScanning probe microscopy

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