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Atom Probe Tomography Analysis of Exsolved Mineral Phases
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Atom Probe Reconstruction With a Locally Varying Emitter Shape.

Daniel Beinke1, Guido Schmitz1

  • 1Institute of Materials Science,University of Stuttgart,Heisenbergstr. 3, D-70569 Stuttgart,Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 22, 2018
PubMed
Summary

This study introduces a new atom probe tomography reconstruction method that accounts for variable field emitter curvature. This improves accuracy by using local event density to determine tip shape, outperforming conventional techniques.

Keywords:
atom probe tomographydensity distributionlocal magnificationpoint projectionvarying emitter shapevolume reconstruction

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Atom probe tomography (APT) is a powerful technique for nanoscale chemical analysis.
  • Conventional APT reconstruction methods often assume a spherical or simple geometric tip shape.
  • Accurate reconstruction is crucial for reliable quantitative analysis of material microstructures.

Purpose of the Study:

  • To develop and validate an improved reconstruction method for atom probe tomography.
  • To address the limitations of conventional methods by incorporating variable field emitter curvature.
  • To enhance the accuracy of 3D material reconstruction from APT data.

Main Methods:

  • A novel reconstruction approach utilizing local event density on the detector.
  • Segmentation of the detector and tip surface to extract tip shape information dynamically.
  • Calculation of emitter profile based on observed event density distribution, allowing for non-spherical shapes.

Main Results:

  • Demonstrated improved reconstruction for radially symmetric emitter structures with precipitates.
  • Successfully modeled non-spherical emitter profiles, deviating from the conventional spherical assumption.
  • Quantitative comparison highlighting the advantages over the traditional point projection method.

Conclusions:

  • The new reconstruction method offers higher fidelity for atom probe tomography data.
  • Variable emitter curvature information extracted from event density improves reconstruction accuracy.
  • This advancement is particularly beneficial for analyzing complex microstructures with varying local evaporation fields.