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Calibration of an array projector used for high-speed three-dimensional shape measurements using a single camera
Applied Optics
|November 22, 2018
Summary
This study introduces a novel, model-less calibration method for multi-aperture array projectors (MAAP) used in 3D measurement systems. This technique enables precise 3D reconstruction using a single camera, even with challenging surface discontinuities.
Area of Science:
- Optics and Photonics
- Computer Vision
- Metrology
Background:
- Traditional 3D measurement systems often use digital light processing projectors modeled with an inverse pinhole camera model.
- High-speed multi-aperture array projectors (MAAP) project aperiodic fringes and cannot be modeled using the standard pinhole approach, typically requiring stereo camera setups.
Purpose of the Study:
- To develop a model-less calibration method for MAAP systems.
- To enable single-camera 3D measurements with MAAP technology.
- To overcome limitations of existing calibration techniques for non-pinhole-model projectors.
Main Methods:
- Direct measurement of the multi-aperture array projector's illumination field.
- Development of a novel geometric calibration procedure independent of projector modeling.
- Integration of the calibrated MAAP for 3D surface reconstruction.
Main Results:
- Successful model-less calibration of a MAAP system.
- Demonstration of 3D measurement capabilities with a single camera using the calibrated MAAP.
- Validation of the method's effectiveness in the presence of surface discontinuities.
Conclusions:
- The proposed model-less calibration method effectively calibrates MAAP systems.
- This approach facilitates single-camera 3D measurements, expanding the applicability of MAAP technology.
- The technique addresses limitations of traditional projector calibration for advanced 3D metrology.
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