Accelerated and high-quality Fourier ptychographic method using a double truncated Wirtinger criteria

Fourier ptychographic microscopy (FPM) is a recently developed computational microscopy technique for wide-field-of-view and super-resolution complex imaging. Wirtinger-flow-based methods can effectively suppress noise and reduce data acquisition time, but they are time-consuming during the phase reconstruction. In this paper, we present a Wirtinger-flow-based reconstruction method for FPM, which combines the Poisson maximum likelihood objective function, improved truncated Wirtinger criteria, and improved adaptive momentum method. Both the simulation and experimental results demonstrate that the proposed method runs faster and the reconstruction quality is similar to or better than other state-of-the-art Wirtinger-flow-based methods.