Related Experiment Video
Updated: Feb 2, 2026

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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
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Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation
Optics Express
|November 25, 2018
Abstract:
We perform contactless bulk mobility measurements for ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump THz probe experiment. As opposed to above-gap excitation or contact methods, two-photon absorption excites the entire sample thickness producing measurable signals with 1013 carriers/cm3 and higher density. For ZnTe and GaSe samples, the measured mobility using two-photon excitation is higher than that measured with one-photon excitation.
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