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Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary

X Z Liang1, M F Dodge2, J Jiang3

  • 1Department of Engineering, University of Leicester, University Road, Leicester LE1 7RH, UK; Department of Engineering, Engineering Building, Lancaster University, LA1 4YW, UK.

Ultramicroscopy
|November 30, 2018
PubMed

Keywords:
EBSDGeometrically necessary dislocationsNanostructureTEMTKD

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