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Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary

X Z Liang1, M F Dodge2, J Jiang3

  • 1Department of Engineering, University of Leicester, University Road, Leicester LE1 7RH, UK; Department of Engineering, Engineering Building, Lancaster University, LA1 4YW, UK.

Ultramicroscopy
|November 30, 2018
PubMed
Summary

Quantifying nanoscale geometrically necessary dislocation (GND) density is difficult. Transmission Kikuchi diffraction (TKD) offers an accurate, fast, and accessible method for measuring nanoscale GND density, overcoming limitations of conventional techniques.

Keywords:
EBSDGeometrically necessary dislocationsNanostructureTEMTKD

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Quantifying nanoscale geometrically necessary dislocation (GND) density is crucial for understanding material properties.
  • Conventional electron backscatter diffraction (EBSD) lacks the spatial resolution for accurate nanoscale GND density measurements.

Purpose of the Study:

  • To introduce and validate the transmission Kikuchi diffraction (TKD) technique for nanoscale GND density quantification.
  • To compare the TKD-based method with traditional transmission electron microscopy (TEM) for dislocation density analysis.

Main Methods:

  • Utilizing the TKD technique to precisely measure lattice orientation at the nanoscale.
  • Calculating nanoscale GND density from the high-resolution orientation data obtained via TKD.
  • Validating TKD-GND results against established TEM measurements.

Main Results:

  • Successfully measured a variation in GND density ranging from 6 × 1014 to 1016 m-2 in a welded super duplex stainless steel sample.
  • Demonstrated excellent agreement between the dislocation density distribution obtained by TKD-GND and TEM.
  • Established TKD as a viable method for nanoscale GND density assessment.

Conclusions:

  • The TKD-GND method provides an accurate, rapid, and accessible approach for nanoscale dislocation density quantification.
  • TKD overcomes the spatial resolution limitations of conventional EBSD for GND analysis.
  • This technique offers a significant advancement for materials characterization at the nanoscale.