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Updated: Feb 1, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Phase-coherent transport in selectively grown topological insulator nanodots
Christian Weyrich1,2, Martin Lanius1,2, Peter Schüffelgen1,2
1Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, D-52425 Jülich, Germany.
Abstract:
Oxidized Si(111) substrates were pre-structured by electron beam lithography and used as a substrate for the selective growth of three-dimensional topological insulators (TI) by molecular beam epitaxy. The patterned holes were filled up by the TI, i.e. Sb2Te3 and Bi2Te3, to form nanodots. Scanning electron microscopy and focused ion beam cross-sectioning was utilized to determine the morphology and depth profile of the nanodots. The magnetotransport measurements revealed universal conductance fluctuations originating from electron interference in phase-coherent loops. We find that these loops are oriented preferentially within the quintuple layers of the TI with only a small perpendicular contribution. Furthermore, we found clear indications of an conductivity anisotropy between different crystal orientations.
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