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Updated: Feb 1, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Sven Achenbach1, Garth Wells2, Michael Jacobs1
1Department of Electrical and Computer Engineering, University of Saskatchewan, 57 Campus Drive, Saskatoon, Saskatchewan S7N 5A9, Canada.
This study presents a cost-effective method for fabricating high-quality X-ray masks using UV-laser exposure and electroplating. This advancement enhances the availability and affordability of masks for deep X-ray lithography (XRL).
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