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Updated: Feb 1, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Publisher Correction: Measurement of the emission spectrum of a semiconductor laser using laser-feedback
James Keeley1, Joshua Freeman1, Karl Bertling2
1School of Electronic and Electrical Engineering, University of Leeds, Leeds, LS2 9JT, UK.
Abstract:
A correction to this article has been published and is linked from the HTML and PDF versions of this paper. The error has been fixed in the paper.
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