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Related Concept Videos

Atomic Force Microscopy01:08

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The arithmetic mean is usually skewed towards the larger values in the data set. Therefore, to avoid this inherent bias towards smaller values, the harmonic mean is used.
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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Intermolecular forces (IMF) are electrostatic attractions arising from charge-charge interactions between molecules. The strength of the intermolecular force is influenced by the distance of separation between molecules. The forces significantly affect the interactions in solids and liquids, where the molecules are close together. In gases, IMFs become important only under high-pressure conditions (due to the proximity of gas molecules). Intermolecular forces dictate the physical properties of...
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Wavelet analysis of higher harmonics in tapping mode atomic force microscopy.

Zhenyu Wang1, Jianqiang Qian1, Yingzi Li1

  • 1School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100083, China; Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing 100083, China.

Micron (Oxford, England : 1993)
|January 1, 2019
PubMed
Summary

Analytic wavelet transform offers improved analysis of higher harmonics in atomic force microscopy for better nanomechanical property characterization. This method provides more detailed temporal and frequency information than traditional Fourier transforms.

Keywords:
Analytic wavelet transformAtomic force microscopyGeneralized Morse waveletHigher harmonic

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Area of Science:

  • Physics
  • Materials Science
  • Surface Science

Background:

  • Higher harmonics in tapping mode atomic force microscopy (AFM) are crucial for characterizing nanomechanical properties.
  • Traditional Fourier transform methods provide time-averaged amplitude and phase, limiting detailed analysis.
  • Advanced signal processing is needed for a more comprehensive understanding of higher harmonics.

Purpose of the Study:

  • To introduce and evaluate the analytic wavelet transform (AWT) for analyzing higher harmonics in AFM.
  • To demonstrate AWT's capability for time-frequency analysis of tip motion signals.
  • To compare the effectiveness of AWT with the Fourier transform method for nanomechanical characterization.

Main Methods:

  • Application of the analytic wavelet transform to analyze higher harmonics in AFM data.
  • Time-frequency analysis of the tip motion signal to obtain intuitive descriptions of higher harmonics.
  • Investigation of the relationship between extracted higher harmonics and adjustable wavelet parameters.
  • Comparison of amplitude measurements (RMS and peak) from AWT with Fourier transform results.

Main Results:

  • AWT provides intuitive time-frequency descriptions of higher harmonics.
  • Temporal evolutions of higher harmonics are effectively analyzed using AWT.
  • Wavelet parameters allow for the analysis of diverse time and frequency features of higher harmonics.
  • AWT-derived RMS and peak amplitudes offer superior sample property characterization compared to Fourier transform amplitude.

Conclusions:

  • The analytic wavelet transform is a powerful tool for analyzing higher harmonics in AFM.
  • AWT offers enhanced insights into nanomechanical properties through detailed temporal and frequency analysis.
  • Adjustable wavelet parameters enable tailored analysis of higher harmonic features for improved material characterization.