Related Experiment Video
Updated: Jan 31, 2026

Niobium Oxide Films Deposited by Reactive Sputtering: Effect of Oxygen Flow Rate
Published on: September 28, 2019
Nanostructure and Optical Property Investigations of SrTiO₃ Films Deposited by Magnetron Sputtering
Da Xu1, Yafei Yuan2,3, Huanfeng Zhu4
1Department of Optical Science and Engineering, Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Fudan University, Shanghai 200433, China. 09210720010@fudan.edu.cn.
Abstract:
Strontium titanate thin films were deposited on a silicon substrate by radio-frequency magnetron sputtering. The structural and optical properties of these films were characterized by X-ray diffraction, high-resolution transmission electron microscopy, X-ray photoelectron spectroscopy, and spectroscopic ellipsometry, respectively. After annealing at 600⁻800 °C, the as-deposited films changed from amorphous to polycrystalline. It was found that an amorphous interfacial layer appeared between the SrTiO₃ layer and Si substrate in each as-deposited film, which grew thicker after annealing. The optical parameters of the SrTiO₃ film samples were acquired from ellipsometry spectra by fitting with a Lorentz oscillator model. Moreover, we found that the band gap energy of the samples diminished after thermal treatment.
More Related Videos
04:22Author Spotlight: Advancements in High-Performance Thermoelectric Thin Films Through Radio Frequency Magnetron Sputtering
Published on: May 17, 2024
06:49Radio Frequency Magnetron Sputtering of GdBa2Cu3O7âˆ'ÃŽ ´/ La0.67Sr0.33MnO3 Quasi-bilayer Films on SrTiO3 STO Single-crystal Substrates
Published on: April 12, 2019
Related Concept Videos
Properties of Enantiomers and Optical Activity
Phase Transitions: Sublimation and Deposition
Physical and Chemical Properties of Matter
Properties of Transition Metals
General Properties of Solutions
Convolution Properties I
The commutative property reveals that the input and the impulse response of an LTI (Linear Time-Invariant) system can be interchanged without affecting the output: