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Apparent tunneling barrier height and local work function of atomic arrays
Neda Noei1, Alexander Weismann1, Richard Berndt1
1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, 24098 Kiel, Germany.
Apparent tunneling barrier height measurements in scanning tunneling microscopy may not accurately reflect local work function variations. A kinetic-energy contribution, influenced by surface structure, causes these discrepancies, impacting surface analysis accuracy.
Area of Science:
- Surface Science
- Scanning Probe Microscopy
- Condensed Matter Physics
Background:
- Scanning tunneling microscopy (STM) is crucial for surface analysis.
- Apparent tunneling barrier height (Φapp) is commonly used to infer local work function (Φ).
- Accurate work function mapping is vital for understanding surface properties.
Purpose of the Study:
- To investigate the reliability of apparent tunneling barrier height (Φapp) as a measure of local work function (Φ).
- To identify factors causing discrepancies between Φapp and Φ.
- To highlight limitations in using Φapp for surface structure characterization.
Main Methods:
- Spatially resolved measurements using scanning tunneling microscopy.
- Experimental analysis of tunneling barrier height variations.
- Theoretical attribution of discrepancies to kinetic-energy contributions.
Main Results:
- Demonstrated that Φapp can fail as an accurate measure of the local work function Φ.
- Identified a kinetic-energy contribution to Φapp as the source of error.
- Showed this contribution is dependent on the tunneling current filament's lateral extent and local surface structure.
Conclusions:
- Φapp measurements in STM are not always a direct indicator of local work function.
- Surface structure significantly influences the kinetic-energy contribution, affecting Φapp accuracy.
- Rethinking the interpretation of Φapp is necessary for precise surface analysis.
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