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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Cluster expansion based configurational averaging approach to bandgaps of semiconductor alloys
Xi Xu1, Hong Jiang1
1Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China.
Abstract:
Configurationally disordered semiconducting materials including semiconductor alloys [e.g., (GaN)1-x(ZnO)x] and stoichiometric materials with fractional occupation (e.g., LaTiO2N) have attracted a lot of interest recently in search for efficient visible light photo-catalysts. First-principles modeling of such materials poses great challenges due to the difficulty in treating the configurational disorder efficiently. In this work, a configurational averaging approach based on the cluster expansion technique has been exploited to describe bandgaps of ordered, partially disordered (with short-range order), and fully disordered phases of semiconductor alloys on the same footing. We take three semiconductor alloys [Cd1-xZnxS, ZnO1-xSx, and (GaN)1-x(ZnO)x] as model systems and clearly demonstrate that semiconductor alloys can have a system-dependent short-range order that has significant effects on their electronic properties.
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